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Research Abstracts Online
January 2009 - March 2010

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University of Minnesota Twin Cities
Institute of Technology
Department of Chemical Engineering and Materials Science

PI: K. Andre Mkhoyan

Detection Limits in Transmission Electron Microscopy

Transmission electron microscopy (TEM) has allowed detection of single atomic positions in many types of specimens, but there are limitations to the technique. These researchers are quantifying the capabilities and limits of TEM by studying the spread of the electron beam as it propagates through a specimen. Specifically, they study the effect of atomic number and electron channeling on beam spread. This will benefit in determining what types of impurities may be detectable via TEM. An impurity type is categorized by its constituting elements and its position within the specimen. To study the detection limits, the researchers simulate images of various specimens using the multislice method. They use Kirkland’s programs in C that simulate TEM images for a given specimen structure in bright field and dark field; these programs require significant computational time.

Group Members

Aloysius Gunawan, Graduate Student
Anudha Mittal, Graduate Student