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Research Abstracts Online
January 2010 - March 2011

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University of Minnesota Twin Cities
College of Science and Engineering
Department of Chemical Engineering and Materials Science

PI: K. Andre Mkhoyan

Detection Limits in Transmission Electron Microscopy

Transmission electron microscopy (TEM) has allowed detection of single atomic positions in many types of specimens, but there are limitations to the technique. These researchers quantified the capabilities and limits of TEM by studying the spread of the electron beam as it propagates through a specimen. Specifically, they studied the effect of atomic number and electron channeling on beam spread, which helped determine what types of impurities may be detectable via TEM. An impurity type is categorized by its constituting elements and its position within the specimen. To study the detection limits, the researchers simulated images of various specimens using the multislice method. They used Kirkland’s programs in C that simulate TEM images for a given specimen structure in bright field and dark field; these programs require significant computational time.

Group Members

Aloysius Gunawan, Graduate Student
Anudha Mittal, Graduate Student