Multislice STEM Image Simulation
This research focuses on atomic-level analytical electron microscopy and spectroscopy. To reach essential science for materials development, the researchers are continuing to work to find the key factors to control material properties. Most of these factors, which have not been well understood, are “subtle features” inside the materials. The challenge to unveil the origin of many material properties is primarily associated with the lack of understanding of the subtle features such as interfaces, defects, doping, and strains. Atomic-resolution scanning transmission electron microscopy (STEM) with EELS and EDX spectroscopy is utilized for the research. The group is conducting extensive multislice STEM imaging simulation and beam channeling in materials.
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