Transmission Electron Microscopy
Topological insulators are 2D materials that are interesting for optoelectronic and magnetic applications. A significant area in this field that these researchers are interested in is the development of heterostructures of these materials with useful emergent properties. They are performing experimental electron microscopy studies and simulation is extremely important to undertand the experimental data.
The group is also interested in the characterization of doped semiconductors. In order to understand the position and surrounding electronic structure of individual dopant atoms detected with their electron microscope, it is important to simulate beam propagation through samples.
The group's simulations are primarily performed using the multislice method based on the TEMsim code published by Kirkland. These calculations will build on previous studies by this research group and expand into new and interesting materials systems.
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