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Project abstract for group mkhoyank
Transmission Electron Microscopy: Understanding High-Resolution Images
The work in this group is based on examining the atomic and electronic structure of hard materials atomic-level spatial resolution using transmission electron microscopy (TEM). TEM images, diffraction patterns (DPs), and spectroscopic data are often difficult, even impossible, to understand intuitively. At high spatial resolution, TEM data is subject to change based on the exact path of the electrons incident on the specimen. These researchers simulate images and DPs of possible structures and compare them with experimental results to make conclusions about the properties of materials of interest. They also work on accurate understanding of data by calculating paths and interference patterns of electrons that transmit through the specimen. They use MSI resources to carry out these calculations.