Simulation of Analytical Transmission Electron Microscopy
Work in the Mkhoyan group is based on examining the atomic and electronic structure of hard materials. Transmission electron microscopy (TEM) is used to study materials at the atomic scale. TEM images, diffraction patterns, and spectroscopic data are impossible to interpret quantitatively without comparison to simulation; furthermore, the propagation of electron beams in solids cannot be observed directly, so simulation serves as the only means to "peak inside" the electron-specimen interaction. MSI resources support this computationally intensive usage of existing open-source C/C++ simulation software developed by E.J. Kirkland, as well as three different development projects: adaptation of the codes to run on GPU architecture, modifying elastic scattering for the effects of chemical bonding, and inclusion of inelastic scattering.
A bibliography of this group’s publications is attached.
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