Project abstract for group mkhoyank

Examining Chemical Bonding in Crystals by Scanning Transmission Electron Microcopy

Scanning transmission electron microscopy (STEM) with electron-energy-loss spectroscopy (EELS) is a powerful tool for studying bonding at the atomic scale in crystalline solids. The bonding properties of defects in hexagonal boron nitride (h-BN) are being studied using STEM with EELS, and the effects of bonding on STEM image formation are also being extensively examined. The results of these studies will determine prospective applications of h-BN with engineered defects, elucidate fundamental processes of image and spectrum formation in STEM, and establish procedures for improved STEM image simulation.

A bibliography of this group's publications acknowledging MSI is attached.